2014-2015 Graduate Course Catalog 
    
    May 02, 2024  
2014-2015 Graduate Course Catalog [ARCHIVED CATALOG]

CSE 772 - Testing of Digital Circuits

3 credit(s) Upon sufficient interest
Physical circuit failures and fault models. Test generation algorithms. Fault stimulation and fault coverage. Random pattern testing. Sequential circuit testing. Test application and response processing techniques. Memory, PLA, and function testing. Design for test.