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Mar 03, 2025
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2016-2017 Graduate Course Catalog [ARCHIVED CATALOG]
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CSE 772 - Testing of Digital CircuitsCollege of Engineering and Computer Science
3 credit(s) Upon sufficient interest
Physical circuit failures and fault models. Test generation algorithms. Fault stimulation and fault coverage. Random pattern testing. Sequential circuit testing. Test application and response processing techniques. Memory, PLA, and function testing. Design for test.
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